 
  
  
   
D. Lovall, R.P. Andres  and R. Reifenberger
  and R. Reifenberger 
Department of Physics, Purdue University, W. Lafayette, IN 47907
   School of Chemical Engineering, Purdue University, W. Lafayette, IN
47907
 School of Chemical Engineering, Purdue University, W. Lafayette, IN
47907
submitted Oct. 30, 1995
The utility of field-ion microscopy (FIM) in studying the shape and orientation of a supported, nanometer-size Au cluster is discussed. By comparing computer simulations of an FIM image to experimental FIM data, the structure and orientation of the supported cluster can be determined.
 
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