Electrical conduction through nanotubes
Electrostatic potential profile through nanotubes
Selected papers on nanotube research
Electrical contact through nanocluster on semiconductor
Self-assembly of cluster network
Single electron tunneling through nanocluster
Selected papers on nanocluster research
|Molecular wire research:
Electrical condcution through molecules
Selected papers on molecular wire research
|Break Junction research:|
Quantized conductance of Au break junctions
Scanning Probe Microscopy (SPM) is a process that is used to study the properties of surfaces at the atomic level. A Scanning Probe Microscope takes a probe that is atomically sharp and scans it over a surface, typically at a distance of a few angstroms or nanometers. In this research group, two different types of SPMs are used, an Atomic Force Microscope and a Scanning Tunneling Microscope.
Carbon nanotubes we discovered as early as 1975 (probably earlier), and TEM images of them were published by Endo et al.. In the wake of the Bucky-Ball (C60)fever, carbon nanotubes we "re-discovered" by Iijima (Nature 391, 1991). They represent real 1D systems for laboratory study. There has been much speculation about the physical and electronic properties of carbon nanotubes. As a natural extension of our expertise in nanoscale technology, we are using the techniques of field emission, STM, and transport measurements to study the electronic properties of carbon nanotubes. We have also developed a novel technique for making extremely good electrical contacts to the ends of a single nanotube (see Appl. Phys. Lett (APL) 74 p. 323-325.)
Field-ion microscopy (FIM) can be used to study the structural properties of substances. A very sharp tip is placed inside a chamber containing a small amount of gas, usually hydrogen or helium, and pointed towards an imaging screen. A very high electric field is applied. As gas atoms near the tip are ionized they are drawn towards the screen by the electric field and an image of the surface of the tip is formed, typically with 2-5 angstrom resolution.
Last modified: Wed Dec 15 19:30:17 EST 1999