P_2x4T_166

P_2x4T_166_C-15

Production testing

Date:8/7/2007

Operator: Emily Grace

start testing time:11:04 AM

Sensor: S_2x4T_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XH4KFBT 74B

ROC1 XH4KFBT 74A

ROC2 KMNG2DT 44D

ROC3 XH4KFBT 73A

ROC4 XH4KFBT 74D

ROC5 XH4KFBT 74C

ROC6 XH4KFBT 73D

ROC7 XH4KFBT 73C

ROC	ROC wafer	Label
ROC0	XH4KFBT	74B
ROC1	XH4KFBT	74A
ROC2	KMNG2DT	44D
ROC3	XH4KFBT	73A
ROC4	XH4KFBT	74D
ROC5	XH4KFBT	74C
ROC6	XH4KFBT	73D
ROC7	XH4KFBT	73C

This plaquette was reworked. Old results here

Inspected by Arndt Kirk on date 7/31/2007

LR_dev 0.005

LL_dev 0.015

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Arndt Kirk

Assembled at HALF-PRESSURE. no assembly problems. reworked BBM No wirebonding problems (reworked BBM - 2nd bond foot on original ROCs).

PLAQUETTE made READY for ENCAPSULATION on 7/31/2007 by Arndt Kirk

PLAQUETTE encapsulated on 7/31/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 7/31/2007 by Ozhan Koybasi

P_2x4T_166_Con 7/31/2007 1:18 PM

P_2x4T_166_C-1on 7/31/2007 1:25 PM

P_2x4T_166_C-2on 8/1/2007 1:42 PM

P_2x4T_166_C-3on 8/1/2007 1:50 PM

P_2x4T_166_C-4on 8/2/2007 12:24 PM

P_2x4T_166_C-5on 8/2/2007 12:32 PM

P_2x4T_166_C-6on 8/2/2007 12:39 PM

P_2x4T_166_C-7on 8/2/2007 12:50 PM

P_2x4T_166_C-8on 8/3/2007 12:17 PM

P_2x4T_166_C-9on 8/6/2007 9:18 AM

P_2x4T_166_C-10on 8/6/2007 9:43 AM

P_2x4T_166_C-11on 8/6/2007 10:27 AM

P_2x4T_166_C-12on 8/6/2007 12:56 PM

P_2x4T_166_C-13on 8/6/2007 1:16 PM

PLAQUETTE TESTED on 2007-08-06 by Gino Bolla

IV_XML-File

Maximum Voltage 450 V

LASER_XML-File

Depletion Voltage 44 V

Operational Voltage 84 V

ROC	ROC0	ROC1	ROC2	ROC3	ROC4	ROC5	ROC6	ROC7
Ibias_DAC	158	160	154	146	162	156	158	148
Vana	144	124	127	132	130	145	133	125
Cal_Del	83	81	75	68	93	81	80	82
Vthrs_Comp	83	82	80	84	82	76	75	75
Unbumped	1	1	0	2	0	0	0	0
Dead	0	0	0	0	33	12	4	1
Noisy	0	0	0	1	0	0	0	0
Undecoded	0	0	0	0	0	0	0	0
Total BAD	1	1	0	3	33	12	4	1

ASSEMBLY_XML-File	SUMMARY_XML-File, and SUMMARY_PER_ROC_XML-File
	I_BIAS_DAC_XML-File
	VANA_XML-File
	DEAD_XML-File
	NOISY_XML-File
	UNDECODED_XML-File
	LIGHT_XML-File

EXTRA DACs for NOISE

VHldDe	110	130	115	145	130	95	100	135
Vsf	140	135	135	140	135	145	140	140
VoffsetOp	90	75	60	85	80	75	55	65
VIbias_PH	100	105	105	100	95	100	100	95

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 158 160 154 146 162 156 158 148

Vana, VanaData 144 123 127 132 130 145 133 125

CalDelData and plots 83 81 75 68 93 81 80 82

VthrCompData and plots 84 82 80 84 83 76 75 76

TestDdata ,TestD Plots 6 13 8 17 55 33 18 2

LightData ,Light Plots 0 0 0 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD BAD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	110	150	130	145	145	100	115	125
Vsf	140	140	140	140	140	145	145	135
VoffsetOp	95	80	65	95	85	75	60	65
VIbias_PH	105	105	105	95	95	110	100	100

ROC0 NOISE			MEAN = NaN SIGMA = NaN
ROC1 NOISE			MEAN = NaN SIGMA = NaN
ROC2 NOISE			MEAN = NaN SIGMA = NaN
ROC3 NOISE			MEAN = NaN SIGMA = NaN
ROC4 NOISE			MEAN = NaN SIGMA = NaN
ROC5 NOISE			MEAN = NaN SIGMA = NaN
ROC6 NOISE			MEAN = NaN SIGMA = NaN
ROC7 NOISE			MEAN = NaN SIGMA = NaN

Comment (if any):

This Device have been tested 15Times prior to this one and here are the links to the previous tests:

P_2x4T_166_C-1.html,

P_2x4T_166_C-10.html,

P_2x4T_166_C-11.html,

P_2x4T_166_C-12.html,

P_2x4T_166_C-13.html,

P_2x4T_166_C-14.html,

P_2x4T_166_C-2.html,

P_2x4T_166_C-3.html,

P_2x4T_166_C-4.html,

End testing time: 11:46 AM

Ibias_DAC, Ibias_DAC Data	158	160	154	146	162	156	158	148
Vana, VanaData	144	123	127	132	130	145	133	125
CalDelData and plots	83	81	75	68	93	81	80	82
VthrCompData and plots	84	82	80	84	83	76	75	76
TestDdata ,TestD Plots	6	13	8	17	55	33	18	2
LightData ,Light Plots	0	0	0	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	BAD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD