P_2x3B_036_C-7

Production testing

Date:4/19/2007

Operator: Gino Bolla

start testing time:8:48 AM

Sensor: S_2x3B_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET67B
ROC1XE4KFET68C
ROC2XE4KFET62D
ROC3XE4KFET64C
ROC4XE4KFET65C
ROC5XE4KFET75A

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 138 142 130 142 142 126
Vana, VanaData 128 144 157 142 118 129
CalDelData and plots93730887886
VthrCompData and plots74770827171
TestDdata ,TestD Plots0110263
LightData ,Light Plots010500
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe125105095145120
Vsf1401400140140140
VoffsetOp90800756565
VIbias_PH1001000100105105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.355176

SIGMA = 0.335881
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.822066

SIGMA = 0.384577
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = NaN

SIGMA = NaN
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.073236

SIGMA = 0.413334
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.225542

SIGMA = 0.424744
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 5.553603

SIGMA = 0.446920

Comment (if any):

This Device have been tested 7Times prior to this one and here are the links to the previous tests:

P_2x3B_036_C-1.html,

P_2x3B_036_C-2.html,

P_2x3B_036_C-3.html,

P_2x3B_036_C-4.html,

P_2x3B_036_C-5.html,

P_2x3B_036_C-6.html,

P_2x3B_036_C.html,

End testing time: 9:10 AM