P_2x3B_036_C-3

Production testing

Date:2/6/2007

Operator: Gino Bolla

start testing time:2:48 PM

Sensor: S_2x3B_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET67B
ROC1XE4KFET68C
ROC2XE4KFET62D
ROC3XE4KFET64C
ROC4XE4KFET65C
ROC5XE4KFET75A

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150

Noise MAP

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Noise MAP

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Ibias_DAC, Ibias_DAC Data 142 144 132 144 144 126
Vana, VanaData 127 144 132 142 118 129
TestDdata ,TestD Plots0053200
LightData ,Light Plots01143600
Pass/Fail TestD GOOD GOOD BAD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD BAD GOOD GOOD GOOD

Noise MAP

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Noise MAP

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ROC0 NOISE[IMAGE] of [IMAGE] of
ROC1 NOISE[IMAGE] of [IMAGE] of
ROC2 NOISE[IMAGE] of [IMAGE] of
ROC3 NOISE[IMAGE] of [IMAGE] of
ROC4 NOISE[IMAGE] of [IMAGE] of
ROC5 NOISE[IMAGE] of [IMAGE] of
ROC6 NOISE[IMAGE] of [IMAGE] of
ROC7 NOISE[IMAGE] of [IMAGE] of
ROC8 NOISE[IMAGE] of [IMAGE] of
ROC9 NOISE[IMAGE] of [IMAGE] of

Comment (if any): NONE

This Device have been tested 3Times prior to this one and here are the links to the previous tests:

P_2x3B_036_C-1.html,

P_2x3B_036_C-2.html,

P_2x3B_036_C.html,

End testing time: 2:59 PM