P_2x3B_036_C-6

Production testing

Date:2/6/2007

Operator: Gino Bolla

start testing time:3:26 PM

Sensor: S_2x3B_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET67B
ROC1XE4KFET68C
ROC2XE4KFET62D
ROC3XE4KFET64C
ROC4XE4KFET65C
ROC5XE4KFET75A

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 142 144 132 144 144 126
Vana, VanaData 127 144 132 142 118 129
TestDdata ,TestD Plots0059210
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD BAD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Noise MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of MEAN = 4.799177SIGMA = 0.347251[IMAGE] of
ROC1 NOISE[IMAGE] of MEAN = 5.105795SIGMA = 0.388067[IMAGE] of
ROC2 NOISE[IMAGE] of MEAN = 4.606733SIGMA = 0.355626[IMAGE] of
ROC3 NOISE[IMAGE] of MEAN = 5.097125SIGMA = 0.410629[IMAGE] of
ROC4 NOISE[IMAGE] of MEAN = 4.641418SIGMA = 0.333612[IMAGE] of
ROC5 NOISE[IMAGE] of MEAN = 4.748652SIGMA = 0.398919[IMAGE] of
ROC6 NOISE[IMAGE] of MEAN = NaNSIGMA = NaN[IMAGE] of
ROC7 NOISE[IMAGE] of MEAN = NaNSIGMA = NaN[IMAGE] of
ROC8 NOISE[IMAGE] of MEAN = NaNSIGMA = NaN[IMAGE] of
ROC9 NOISE[IMAGE] of MEAN = NaNSIGMA = NaN[IMAGE] of

Comment (if any):

This Device have been tested 6Times prior to this one and here are the links to the previous tests:

P_2x3B_036_C-1.html,

P_2x3B_036_C-2.html,

P_2x3B_036_C-3.html,

P_2x3B_036_C-4.html,

P_2x3B_036_C-5.html,

P_2x3B_036_C.html,

End testing time: 3:35 PM