Sensor: S_2x5_168, Data for leakage current measurement , and plot on overall it is a GOOD sensor
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | KBNG0QT | 73D |
| ROC1 | KBNG0QT | 14C |
| ROC2 | KBNG0QT | 04B |
| ROC3 | KBNG0QT | 63A |
| ROC4 | KFNG13T | 22D |
| ROC5 | KBNG0QT | 53B |
| ROC6 | KBNG0QT | 04D |
| ROC7 | KBNG0QT | 53C |
| ROC8 | KBNG0QT | 04C |
| ROC9 | KBNG0QT | 15B |
This plaquette was reworked. Old results here
Inspected by Lockwood Gale on date 8/21/2007
| LR_dev | 0.042 |
| LL_dev | 0.014 |
PLAQUETTE GLUED with HALF PRESSURE
| FINAL COMMENT by Lockwood Gale | Assembled at HALF-PRESSURE. No assembly problems. ROC 8, ch 1, ROc 4, Ch 35, ROC 6, CH 1 No wirebonding problems. |
PLAQUETTE made READY for ENCAPSULATION on 8/21/2007 by Lockwood Gale
PLAQUETTE encapsulated on 8/21/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 8/21/2007 by Ozhan Koybasi
P_2x5_168_Con 8/22/2007 11:08 AM
P_2x5_168_C-1on 8/22/2007 12:04 PM
P_2x5_168_C-2on 8/22/2007 12:05 PM
| Ibias_DAC, Ibias_DAC Data | 150 | 172 | 160 | 156 | 150 | 162 | 170 | 168 | 164 | 170 |
| Vana, VanaData | 127 | 140 | 130 | 140 | 127 | 130 | 145 | 150 | 141 | 149 |
| CalDelData and plots | 86 | 74 | 68 | 83 | 72 | 71 | 84 | 69 | 69 | 77 |
| VthrCompData and plots | 74 | 82 | 83 | 77 | 82 | 89 | 79 | 89 | 83 | 84 | Depletion Voltage is -46 and suggested operational voltage is -86
| TestDdata ,TestD Plots | 142 | 0 | 13 | 2 | 0 | 0 | 2 | 0 | 72 | 0 |
| LightData ,Light Plots | 159 | 1 | 30 | 7 | 0 | 2 | 7 | 2 | 0 | 0 |
| Pass/Fail TestD | BAD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | BAD | GOOD |
| Pass/Fail LIGHT | BAD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Noise MAP at VMAX
Efficiency MAP
EXTRA DACs for NOISE
| VHldDe | 140 | 100 | 120 | 100 | 120 | 105 | 95 | 95 | 100 | 95 |
| Vsf | 135 | 135 | 135 | 140 | 140 | 145 | 150 | 150 | 145 | 145 |
| VoffsetOp | 90 | 105 | 100 | 75 | 70 | 95 | 100 | 105 | 100 | 95 |
| VIbias_PH | 95 | 100 | 105 | 100 | 105 | 105 | 100 | 100 | 95 | 100 |
Comment (if any):
This Device have been tested 2Times prior to this one and here are the links to the previous tests:End testing time: 12:59 PM