P_2x4T_025_C-1

Production testing

Date:1/24/2007

Operator: Isaac Childres

start testing time:11:22 AM

Sensor: S_2x4T_02, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET25B
ROC1XE4KFET23B
ROC2XE4KFET21C
ROC3XE4KFET36D
ROC4XE4KFET20A
ROC5XE4KFET22D
ROC6XE4KFET20D
ROC7XE4KFET37D

Inspected by Lockwood Gale on date 1/18/2007
LR_dev0.040
LL_dev0.031
FINAL COMMENT by Lockwood GaleNo assembly problems. No wirebonding problems.

PLAQUETTE made READY for testing on 1/18/2007 by Lockwood Gale

P_2x4T_025_Con 1/18/2007 2:09 PM

P_2x4T_025_Con 1/18/2007 2:09 PM

PLAQUETTE TESTED on 2007-01-18 by Gino Bolla

[IMAGE] of
IV_XML-File
Maximum Voltage 600 V
[IMAGE] of
LASER_XML-File
Depletion Voltage 50 V
Operational Voltage 90 V

ROCROC0ROC1ROC2ROC3ROC4ROC5ROC6ROC7
Ibias_DAC140118118138146132132126
Vana139133126137138134110111
Cal_Del8997927681878286
Vthrs_Comp7966647979717063
Unbumped00000000
Dead00000000
Noisy00000000
Undecoded00000000
Total BAD00000000

ASSEMBLY_XML-File SUMMARY_XML-File, and SUMMARY_PER_ROC_XML-File
[IMAGE] of I_BIAS_DAC_XML-File
[IMAGE] of VANA_XML-File
[IMAGE] of DEAD_XML-File
[IMAGE] of NOISY_XML-File
[IMAGE] of UNDECODED_XML-File
[IMAGE] of LIGHT_XML-File

PLAQUETTE READY TO BE POTTED

PLAQUETTE encapsulated on 1/24/2007 by Arndt Kirk

P_2x4T_025_C-1on 1/24/2007 11:22 AM

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 140 118 118 138 146 132 132 126
Vana, VanaData 139 133 126 137 138 134 110 111
TestDdata ,TestD Plots00000100
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4T_025_C.html,

End testing time: 11:27 AM