Sensor: S_2x4T_02, Data for leakage current measurement , and plot on overall it is a GOOD sensor
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | XE4KFET | 25B |
| ROC1 | XE4KFET | 23B |
| ROC2 | XE4KFET | 21C |
| ROC3 | XE4KFET | 36D |
| ROC4 | XE4KFET | 20A |
| ROC5 | XE4KFET | 22D |
| ROC6 | XE4KFET | 20D |
| ROC7 | XE4KFET | 37D |
Inspected by Lockwood Gale on date 1/18/2007
| LR_dev | 0.040 |
| LL_dev | 0.031 |
| FINAL COMMENT by Lockwood Gale | No assembly problems. No wirebonding problems. |
PLAQUETTE made READY for testing on 1/18/2007 by Lockwood Gale
P_2x4T_025_Con 1/18/2007 2:09 PM
| Ibias_DAC, Ibias_DAC Data | 140 | 118 | 118 | 138 | 146 | 132 | 132 | 126 |
| Vana, VanaData | 139 | 133 | 126 | 137 | 138 | 134 | 110 | 111 |
| CalDelData and plots | 89 | 97 | 92 | 76 | 81 | 87 | 82 | 86 |
| VthrCompData and plots | 79 | 66 | 64 | 79 | 79 | 71 | 70 | 63 | Depletion Voltage is -50 and suggested operational voltage is -90
| TestDdata ,TestD Plots | 0 | 0 | 0 | 0 | 0 | 0 | 1 | 0 |
| LightData ,Light Plots | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 |
| Pass/Fail TestD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
| Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Comment (if any):
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 2:23 PM
