Sensor: S_2x4B_08, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | W32_XA4K5NT | 40B |
ROC1 | W32_XA4K5NT | 40A |
ROC2 | W32_XA4K5NT | 58D |
ROC3 | W32_XA4K5NT | 58B |
ROC4 | W32_XA4K5NT | 37D |
ROC5 | W32_XA4K5NT | 38A |
ROC6 | W32_XA4K5NT | 39A |
ROC7 | W32_XA4K5NT | 39C |
Ibias_DAC, Ibias_DAC Data | 110 | 116 | 130 | 144 | 126 | 124 | 112 | 132 |
Vana, VanaData | 136 | 160 | 158 | 172 | 157 | 155 | 151 | 151 |
CalDelData and plots | 79 | 94 | 95 | 78 | 85 | 87 | 86 | 87 |
VthrCompData and plots | 72 | 78 | 75 | 85 | 69 | 76 | 78 | 85 | FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -90
TestDdata ,TestD Plots | 0 | 1 | 0 | 0 | 0 | 0 | 0 | 0 |
LightData ,Light Plots | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 |
Pass/Fail TestD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Comment (if any): after encapsulation and thermal cycle, at -20degC
This Device have been tested 11Times prior to this one and here are the links to the previous tests:End testing time: 12:13 PM