P_2x4B_082_A-11

Production testing

Date:1/9/2007

Operator: Petra Merkel

start testing time:11:59 AM

Sensor: S_2x4B_08, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W32_XA4K5NT40B
ROC1W32_XA4K5NT40A
ROC2W32_XA4K5NT58D
ROC3W32_XA4K5NT58B
ROC4W32_XA4K5NT37D
ROC5W32_XA4K5NT38A
ROC6W32_XA4K5NT39A
ROC7W32_XA4K5NT39C

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 110 116 130 144 126 124 112 132
Vana, VanaData 136 160 158 172 157 155 151 151
CalDelData and plots7994957885878687
VthrCompData and plots7278758569767885
TestDdata ,TestD Plots01000000
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): after encapsulation and thermal cycle, at -20degC

This Device have been tested 11Times prior to this one and here are the links to the previous tests:

P_2x4B_082_A-1.html,

P_2x4B_082_A-10.html,

P_2x4B_082_A-2.html,

P_2x4B_082_A-3.html,

P_2x4B_082_A-4.html,

P_2x4B_082_A-5.html,

P_2x4B_082_A-6.html,

P_2x4B_082_A-7.html,

P_2x4B_082_A-8.html,

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End testing time: 12:13 PM