Sensor: S_2x4B_03, Data for leakage current measurement , and plot on overall it is a BAD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | XW4KFXT | 18C |
ROC1 | XW4KFXT | 13C |
ROC2 | XW4KFXT | 17B |
ROC3 | XW4KFXT | 17C |
ROC4 | XW4KFXT | 27C |
ROC5 | XW4KFXT | 14B |
ROC6 | XW4KFXT | 17D |
ROC7 | XW4KFXT | 28A |
Inspected by Lockwood Gale on date 4/13/2007
LR_dev | 0.046 |
LL_dev | 0.049 |
PLAQUETTE GLUED with HALF PRESSURE
FINAL COMMENT by Lockwood Gale | No assembly problems. Assembled at HALF-PRESSURE.No wirebond problems. |
PLAQUETTE made READY for ENCAPSULATION on 4/13/2007 by Lockwood Gale
PLAQUETTE encapsulated on 4/13/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 4/13/2007 by Ozhan Koybasi
P_2x4B_032_Con 4/17/2007 9:20 AM
P_2x4B_032_Con 4/17/2007 9:20 AM
P_2x4B_032_C-1on 4/17/2007 9:41 AM
Ibias_DAC, Ibias_DAC Data | 144 | 132 | 128 | 130 | 134 | 146 | 138 | 140 |
Vana, VanaData | 158 | 133 | 124 | 122 | 129 | 141 | 111 | 115 |
CalDelData and plots | 83 | 83 | 94 | 95 | 78 | 92 | 101 | 96 |
VthrCompData and plots | 89 | 82 | 65 | 66 | 66 | 75 | 68 | 75 | Depletion Voltage is -56 and suggested operational voltage is -96
TestDdata ,TestD Plots | 0 | 0 | 0 | 1 | 3 | 0 | 0 | 2 |
LightData ,Light Plots | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 2 |
Pass/Fail TestD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Noise MAP
Efficiency MAP
EXTRA DACs for NOISE
VHldDe | 95 | 130 | 130 | 115 | 115 | 105 | 170 | 145 |
Vsf | 145 | 145 | 130 | 135 | 140 | 140 | 130 | 135 |
VoffsetOp | 125 | 90 | 70 | 80 | 80 | 80 | 65 | 65 |
VIbias_PH | 100 | 105 | 95 | 100 | 100 | 100 | 100 | 100 |
Comment (if any): GOOD
This Device have been tested 1Times prior to this one and here are the links to the previous tests:End testing time: 10:01 AM