P_2x4B_032

P_2x4B_032_C

Production testing

Date:4/17/2007

Operator: Gino Bolla

start testing time:9:20 AM

Sensor: S_2x4B_03, Data for leakage current measurement , and plot on overall it is a BAD sensor

ROC ROC wafer Label

ROC0 XW4KFXT 18C

ROC1 XW4KFXT 13C

ROC2 XW4KFXT 17B

ROC3 XW4KFXT 17C

ROC4 XW4KFXT 27C

ROC5 XW4KFXT 14B

ROC6 XW4KFXT 17D

ROC7 XW4KFXT 28A

ROC	ROC wafer	Label
ROC0	XW4KFXT	18C
ROC1	XW4KFXT	13C
ROC2	XW4KFXT	17B
ROC3	XW4KFXT	17C
ROC4	XW4KFXT	27C
ROC5	XW4KFXT	14B
ROC6	XW4KFXT	17D
ROC7	XW4KFXT	28A

Inspected by Lockwood Gale on date 4/13/2007

LR_dev 0.046

LL_dev 0.049

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood Gale

No assembly problems. Assembled at HALF-PRESSURE.No wirebond problems.

PLAQUETTE made READY for ENCAPSULATION on 4/13/2007 by Lockwood Gale

PLAQUETTE encapsulated on 4/13/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 4/13/2007 by Ozhan Koybasi

P_2x4B_032_Con 4/17/2007 9:20 AM

Depletion Voltage is -54 and suggested operational voltage is -94

Ibias_DAC, Ibias_DAC Data	144	130	126	128	132	146	134	138
Vana, VanaData	158	133	125	122	130	142	111	116
CalDelData and plots	83	83	94	95	78	92	101	96
VthrCompData and plots	89	81	66	65	67	76	68	76
TestDdata ,TestD Plots	0	0	0	1	1	1	0	2
LightData ,Light Plots	4159	4159	4159	4158	4158	4159	4159	4159
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	BAD	BAD	BAD	BAD	BAD	BAD	BAD	BAD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	95	125	140	130	125	105	170	150
Vsf	150	140	135	140	145	140	135	135
VoffsetOp	125	90	70	80	80	80	65	65
VIbias_PH	100	105	95	95	100	100	100	100

ROC0 NOISE			MEAN = 4.039683 SIGMA = 0.313806
ROC1 NOISE			MEAN = 5.220360 SIGMA = 0.407748
ROC2 NOISE			MEAN = 5.487901 SIGMA = 0.418500
ROC3 NOISE			MEAN = 4.679468 SIGMA = 0.387650
ROC4 NOISE			MEAN = 5.058103 SIGMA = 0.405360
ROC5 NOISE			MEAN = 5.318023 SIGMA = 0.434776
ROC6 NOISE			MEAN = 5.450246 SIGMA = 0.433879
ROC7 NOISE			MEAN = 5.182813 SIGMA = 0.421752

Comment (if any): Light source was not connected

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 9:40 AM