P_2x4B_004_C-2

Production testing

Date:2/9/2007

Operator: Isaac Childres

start testing time:3:23 PM

Sensor: S_2x4B_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XG4KFCT67B
ROC1XG4KFCT67A
ROC2XG4KFCT66B
ROC3XG4KFCT66A
ROC4XG4KFCT63B
ROC5XG4KFCT64B
ROC6XG4KFCT65A
ROC7XG4KFCT65B

Depletion Voltage is -52 and suggested operational voltage is -92
Ibias_DAC, Ibias_DAC Data 140 144 126 126 122 132 140 128
Vana, VanaData 140 163 122 126 130 127 129 142
CalDelData and plots8057959297699290
VthrCompData and plots8588838374927571
TestDdata ,TestD Plots00100100
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.420091

SIGMA = 0.420210
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.199392

SIGMA = 0.391126
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.770656

SIGMA = 0.432656
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.066464

SIGMA = 0.399947
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.117594

SIGMA = 0.408934
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.960906

SIGMA = 0.367377
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 5.095613

SIGMA = 0.400333
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 5.467827

SIGMA = 0.463329

Comment (if any): Okay.

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_2x4B_004_C-1.html,

P_2x4B_004_C.html,

End testing time: 3:46 PM