P_2x4B_004_C

Production testing

Date:2/9/2007

Operator: Isaac Childres

start testing time:2:33 PM

Sensor: S_2x4B_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XG4KFCT67B
ROC1XG4KFCT67A
ROC2XG4KFCT66B
ROC3XG4KFCT66A
ROC4XG4KFCT63B
ROC5XG4KFCT64B
ROC6XG4KFCT65A
ROC7XG4KFCT65B

Laser failure
Ibias_DAC, Ibias_DAC Data 140 144 126 126 122 132 140 128
Vana, VanaData 140 163 122 126 130 126 129 142
CalDelData and plots8057959297699290
VthrCompData and plots00000000