P_2x3T_176_C

Parts committed by Arndt Kirk on date 5/10/2007

PartID
BBMBBM_176-2x3T
VHDI2x3_247

ROCROC waferLabel
ROC0KFNG13T14B
ROC1KFNG13T14D
ROC2KFNG13T24C
ROC3KFNG13T63C
ROC4KFNG13T15C
ROC5KFNG13T63B

Inspected by Lockwood Gale on date 5/11/2007
LR_dev0.042
LL_dev0.030

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood GaleAssembled at HALF-PRESSURE. No assembly problems. No wirebonding problems.

PLAQUETTE made READY for ENCAPSULATION on 5/11/2007 by Lockwood Gale

PLAQUETTE encapsulated on 5/11/2007 by Ortiz Jason

PLAQUETTE made READY for testing on 5/11/2007 by Ortiz Jason

P_2x3T_176_Con 5/14/2007 9:53 AM

P_2x3T_176_Con 5/14/2007 9:53 AM

PLAQUETTE TESTED on 2007-05-14 by Gino Bolla

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IV_XML-File
Maximum Voltage 290 V
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LASER_XML-File
Depletion Voltage 46 V
Operational Voltage 86 V

ROCROC0ROC1ROC2ROC3ROC4ROC5
Ibias_DAC150164166158154160
Vana138154135129144141
Cal_Del747570837574
Vthrs_Comp838677749186
Unbumped410400741554150325024
Dead000100
Noisy000000
Undecoded000000
Total BAD410400741554151325024

ASSEMBLY_XML-File SUMMARY_XML-File, and SUMMARY_PER_ROC_XML-File
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EXTRA DACs for NOISE

VHldDe110951051359595
Vsf140145140140145140
VoffsetOp851158580105100
VIbias_PH10010010010010095

Noise MAP

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Efficiency MAP

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PLAQUETTE READY TO BE SHIPPED

P_2x3T_176_C-1on 5/18/2007 2:31 PM

P_2x3T_176_C-2on 5/30/2007 3:40 PM

P_2x3T_176_C-2on 5/30/2007 3:40 PM AFTER POTTING

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BAD CHANNELS COMPARISON XML-files/NOW

ROCDEADNOISYUNDECODEDTESTDLIGHT
ROC00/00/00/068/9410/500
ROC10/00/00/03019/22534007/4063
ROC20/00/00/03971/39774155/4154
ROC31/30/00/03899/37214150/4146
ROC40/00/00/02042/14843250/3322
ROC50/00/00/09/124/26

BACK TO MEASURE IT

NOISE measurement taken at -102 V and current -2.245878E-08 , Acurrent 0.171928, Dcurrent 0.454647

Noise MAP

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Efficiency MAP

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NOISE HISTO

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COVERED FROM LASER

NOISE measurement taken at -103 V and current -9.344627E-07 , Acurrent 0.172021, Dcurrent 0.454631

Noise MAP

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Efficiency MAP

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NOISE HISTO

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After a few SHOTS

NOISE measurement taken at -104 V and current -4.020702E-08 , Acurrent 0.172009, Dcurrent 0.454553

Noise MAP

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Efficiency MAP

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NOISE HISTO

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NOISE measurement taken at -105 V and current -1.027126E-06 , Acurrent 0.171920, Dcurrent 0.454485

Noise MAP

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Efficiency MAP

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NOISE HISTO

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NOISE measurement taken at -106 V and current -1.149266E-06 , Acurrent 0.172045, Dcurrent 0.454528

Noise MAP

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Efficiency MAP

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NOISE HISTO

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NOISE measurement taken at -107 V and current -8.846316E-07 , Acurrent 0.172041, Dcurrent 0.454526

Noise MAP

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Efficiency MAP

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NOISE HISTO

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NOISE measurement taken at -108 V and current -1.000829E-06 , Acurrent 0.170425, Dcurrent 0.454541

Noise MAP

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Efficiency MAP

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NOISE HISTO

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NOISE measurement taken at -109 V and current -2.044015E-06 , Acurrent 0.169787, Dcurrent 0.454467

Noise MAP

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Efficiency MAP

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NOISE HISTO

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NOISE measurement taken at -109 V and current -3.004706E-06 , Acurrent 0.167771, Dcurrent 0.453968

Noise MAP

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Efficiency MAP

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NOISE HISTO

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NOISE measurement taken at -110 V and current -1.929871E-06 , Acurrent 0.168062, Dcurrent 0.454518

Noise MAP

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Efficiency MAP

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NOISE HISTO

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Inspected by Arndt Kirk on date 6/1/2007
PictureComment
[IMAGE] of Effect of pulsed IR laser visible on sensor above ROCs 0 and 5, and on encapsulant and surface of ROC 0 near wirebond pads for channels 26-33.

Shipped on date 2007-09-10