P_2x3T_176

P_2x3T_176_C

Production testing

Date:5/14/2007

Operator: Gino Bolla

start testing time:9:53 AM

Sensor: S_2x3T_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 KFNG13T 14B

ROC1 KFNG13T 14D

ROC2 KFNG13T 24C

ROC3 KFNG13T 63C

ROC4 KFNG13T 15C

ROC5 KFNG13T 63B

ROC	ROC wafer	Label
ROC0	KFNG13T	14B
ROC1	KFNG13T	14D
ROC2	KFNG13T	24C
ROC3	KFNG13T	63C
ROC4	KFNG13T	15C
ROC5	KFNG13T	63B

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 150 164 166 158 154 160

Vana, VanaData 138 154 135 129 144 141

CalDelData and plots 74 75 70 83 75 74

VthrCompData and plots 83 86 77 74 91 86

TestDdata ,TestD Plots 68 3019 3971 3900 2042 9

LightData ,Light Plots 410 4007 4155 4150 3250 24

Pass/Fail TestD BAD BAD BAD BAD BAD GOOD

Pass/Fail LIGHT BAD BAD BAD BAD BAD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	110	95	105	135	95	95
Vsf	140	145	140	140	145	140
VoffsetOp	85	115	85	80	105	100
VIbias_PH	100	100	100	100	100	95

ROC0 NOISE			MEAN = 4.516441 SIGMA = 0.362943
ROC1 NOISE			MEAN = 3.948118 SIGMA = 0.329316
ROC2 NOISE			MEAN = 4.032083 SIGMA = 0.319710
ROC3 NOISE			MEAN = 4.187457 SIGMA = 0.326660
ROC4 NOISE			MEAN = 3.836037 SIGMA = 0.318247
ROC5 NOISE			MEAN = 4.149796 SIGMA = 0.347679

Comment (if any): MANY MANY BAD CHANNELS

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:47 AM

Ibias_DAC, Ibias_DAC Data	150	164	166	158	154	160
Vana, VanaData	138	154	135	129	144	141
CalDelData and plots	74	75	70	83	75	74
VthrCompData and plots	83	86	77	74	91	86
TestDdata ,TestD Plots	68	3019	3971	3900	2042	9
LightData ,Light Plots	410	4007	4155	4150	3250	24
Pass/Fail TestD	BAD	BAD	BAD	BAD	BAD	GOOD
Pass/Fail LIGHT	BAD	BAD	BAD	BAD	BAD	GOOD