P_2x3B_133_C-2

Production testing

Date:2/1/2007

Operator: Isaac Childres

start testing time:3:19 PM

Sensor: S_2x3B_13, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET31D
ROC1XE4KFET23D
ROC2XE4KFET24C
ROC3XE4KFET26A
ROC4XE4KFET26B
ROC5XE4KFET28B

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 128 128 140 132 144 138
Vana, VanaData 125 115 144 143 139 134
TestDdata ,TestD Plots200120
LightData ,Light Plots010001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Good.

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_2x3B_133_C-1.html,

P_2x3B_133_C.html,

End testing time: 3:24 PM