P_1x5R_143_A

Production testing

Date:10/23/2007

Operator: Ozhan Koybasi

start testing time:6:40 PM

Sensor: S_1x5R_14, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W30_X74K5RT62C
ROC1W30_X74K5RT62B
ROC2W30_X74K5RT62A
ROC3W30_X74K5RT61B
ROC4W54_D2LQG4T26B
This plaquette has been reworked. Old results

Inspected by Lockwood Gale on date 10/23/2007
LR_dev0.066
LL_dev0.046

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood GaleReworked BBM. Force used to join BBM to VHDI = 1.5 kg per ROC. No assembly problems. ROC 1, CH 32, 5 wo, ROC 4, CH 1 1hb, ROC 3 CH 7, 1hb 2 tries, All wires bonded.

PLAQUETTE made READY for ENCAPSULATION on 10/23/2007 by Lockwood Gale

PLAQUETTE encapsulated on 10/23/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 10/23/2007 by Ozhan Koybasi

P_1x5R_143_Aon 10/23/2007 6:40 PM

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 150 150 150 148 138
Vana, VanaData 122 132 130 144 126
CalDelData and plots8871647494
VthrCompData and plots7374868473
TestDdata ,TestD Plots10020
LightData ,Light Plots00000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe12011012095120
Vsf140140140140140
VoffsetOp80901008095
VIbias_PH100100105100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.468502

SIGMA = 0.345507
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.101560

SIGMA = 0.334601
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.670173

SIGMA = 0.368036
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.516434

SIGMA = 0.359628
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.303429

SIGMA = 0.338928

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 7:10 PM