P_1x5L_040_A-2

Production testing

Date:6/5/2007

Operator: Emily Grace

start testing time:11:39 AM

Sensor: S_1x5L_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W33_XC4K5LT03D
ROC1W33_XC4K5LT03C
ROC2W35_XH4K3HT55B
ROC3W35_XH4K3HT55A
ROC4W33_XC4K5LT03B

Depletion Voltage is -36 and suggested operational voltage is -76
Ibias_DAC, Ibias_DAC Data 144 148 166 166 160
Vana, VanaData 124 141 133 140 132
CalDelData and plots8779807184
VthrCompData and plots7372707682
TestDdata ,TestD Plots124400900
LightData ,Light Plots00415500
Pass/Fail TestD GOOD GOOD BAD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD BAD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe12510514011595
Vsf140145140145135
VoffsetOp7590757095
VIbias_PH105100100100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.658833

SIGMA = 0.371856
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.203856

SIGMA = 0.334089
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.424015

SIGMA = 0.345457
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.709036

SIGMA = 0.378054
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.387266

SIGMA = 0.358654

Comment (if any):

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_1x5L_040_A-1.html,

P_1x5L_040_A.html,

End testing time: 12:02 PM