P_1x5L_004_C-3

Production testing

Date:2/9/2007

Operator: Isaac Childres

start testing time:12:21 PM

Sensor: S_1x5L_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XG4KFCT74B
ROC1XG4KFCT74A
ROC2XG4KFCT73B
ROC3XG4KFCT73A
ROC4XG4KFCT76D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 140 132 142 124 148
Vana, VanaData 135 145 133 128 149
TestDdata ,TestD Plots30000
LightData ,Light Plots30000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.929420

SIGMA = 0.384957
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.802346

SIGMA = 0.385219
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.744986

SIGMA = 0.377296
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.117991

SIGMA = 0.386168
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.858434

SIGMA = 0.458080

Comment (if any): Okay.

This Device have been tested 3Times prior to this one and here are the links to the previous tests:

P_1x5L_004_C-1.html,

P_1x5L_004_C-2.html,

P_1x5L_004_C.html,

End testing time: 12:32 PM