P_1x5L_004_C-1

Production testing

Date:2/7/2007

Operator: Isaac Childres

start testing time:3:25 PM

Sensor: S_1x5L_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XG4KFCT74B
ROC1XG4KFCT74A
ROC2XG4KFCT73B
ROC3XG4KFCT73A
ROC4XG4KFCT76D

Laser
Ibias_DAC, Ibias_DAC Data 140 132 142 126 148
Vana, VanaData 135 145 133 129 150
CalDelData and plots7374867270
VthrCompData and plots8281707885