TEM images of MWNTs mounted on AFM cantilevers
These tips were made by Dr. Monica Luna while she was a visitor of ??'s lab in ??, Japan. She mounted the MWNTs onto the cantilevers in a SEM. These tips were used for AFM measurements by Dr. Luna and Pedro de Pablo at the Laboratorio de Nuevas Microscopias in Madrid, Spain. These images were taken by Elton Graugnard at Purdue University using a JEOL 2000FX. All the images were taken after the tips were used in experiments. Punta is spanish for tip.
- TEM imagen de punta A. The MWNT is ~ 350nm long and ~ 12 nm wide.
200 keV, 100k times magnification, bar length = 200 nanometers.
This clearly shows that the nanotube can offer an improvement over a blunt AFM tip.
- TEM imagenes de punta B. The MWNT is ~ 275nm long and ~ 50 nm wide.
Image (1): 200 keV, 60k times magnification, bar length = 200 nanometers.
Image (2): 200 keV, 150k times magnification, bar length = 100 nanometers.
- TEM imagen de punta C. The MWNT is ~ 350nm long and ~ 12 nm wide.
200 keV, 120k times magnification, bar length = 100 nanometers.
All of the TEM images are here.
Last modified: Fri Jul 19 10:31:19 EST 2002