P_2x5_182_A-1

Production testing

Date:2/19/2007

Operator: Isaac Childres

start testing time:4:11 PM

Sensor: S_2x5_182, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W28_X54K5TT25C
ROC1W28_X54K5TT24A
ROC2W28_X54K5TT23D
ROC3W28_X54K5TT23C
ROC4W28_X54K5TT23A
ROC5W29_X64K5ST62D
ROC6W29_X64K5ST63B
ROC7W29_X64K5ST63C
ROC8W29_X64K5ST63D
ROC9W29_X64K5ST64A

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 124 132 128 142 146 118 124 146 132 142
Vana, VanaData 135 128 132 128 142 139 123 144 140 142
TestDdata ,TestD Plots300000047731
LightData ,Light Plots0000000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD BAD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Okay.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x5_182_A.html,

End testing time: 4:17 PM