P_2x5_182_A

Production testing

Date:2/12/2007

Operator: Isaac Childres

start testing time:11:32 AM

Sensor: S_2x5_182, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W28_X54K5TT25C
ROC1W28_X54K5TT24A
ROC2W28_X54K5TT23D
ROC3W28_X54K5TT23C
ROC4W28_X54K5TT23A
ROC5W29_X64K5ST62D
ROC6W29_X64K5ST63B
ROC7W29_X64K5ST63C
ROC8W29_X64K5ST63D
ROC9W29_X64K5ST64A

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 124 132 128 142 146 118 124 146 132 142
Vana, VanaData 135 128 132 128 142 139 123 144 140 142
CalDelData and plots82757776748487789183
VthrCompData and plots77806782877572898074
TestDdata ,TestD Plots2000010015381
LightData ,Light Plots0000000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD BAD BAD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.999117

SIGMA = 0.501046
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.986353

SIGMA = 0.603657
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 6.418798

SIGMA = 0.748506
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.499416

SIGMA = 0.386465
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 6.624600

SIGMA = 0.621151
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 6.006538

SIGMA = 0.503421
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 6.109335

SIGMA = 0.494858
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 7.832098

SIGMA = 0.633509
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 8.326582

SIGMA = 0.748971
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 7.239251

SIGMA = 0.733564

Comment (if any): Bad spot in Test D, but otherwise okay. Potting.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:51 AM