P_2x5_079

P_2x5_079_A-2

Production testing

Date:10/4/2007

Operator: Gino

start testing time:3:32 PM

Sensor: S_2x5_079, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W13_XX4JPAT 25B

ROC1 W13_XX4JPAT 03D

ROC2 W13_XX4JPAT 24D

ROC3 W13_XX4JPAT 24C

ROC4 W13_XX4JPAT 24B

ROC5 W13_XX4JPAT 28C

ROC6 W13_XX4JPAT 28D

ROC7 W13_XX4JPAT 29B

ROC8 W13_XX4JPAT 29C

ROC9 W13_XX4JPAT 11A

ROC	ROC wafer	Label
ROC0	W13_XX4JPAT	25B
ROC1	W13_XX4JPAT	03D
ROC2	W13_XX4JPAT	24D
ROC3	W13_XX4JPAT	24C
ROC4	W13_XX4JPAT	24B
ROC5	W13_XX4JPAT	28C
ROC6	W13_XX4JPAT	28D
ROC7	W13_XX4JPAT	29B
ROC8	W13_XX4JPAT	29C
ROC9	W13_XX4JPAT	11A

This plaquette was reworked. Old results here

Inspected by Arndt Kirk on date 8/20/2007

LR_dev 0.019

LL_dev 0.018

PLAQUETTE GLUED with FULL PRESSURE

FINAL COMMENT by Arndt Kirk

NO ASSEMBLY PROBLEMS No wirebonding problems.

PLAQUETTE made READY for ENCAPSULATION on 8/20/2007 by Arndt Kirk

PLAQUETTE encapsulated on 8/21/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 8/21/2007 by Ozhan Koybasi

P_2x5_079_Aon 8/23/2007 8:57 AM

Plaq does NOT work. With the HARD reset I can see only the first 7 ROCs. Humongous power consumption on the digital supply. Still The I2C is working well for all ROCs

For now the device stays in testing

Gino Noticed that the capacitor for DV on ROC6 had "way more solder than needed" and suspected a short. The capacitor was removed but the symptoms stay the same.

Inspected by Bolla Gino on date 8/27/2007

Picture Comment

resoldered the capacitor and symptoms stay the same. Only first 7 ROCs visible in the Aout (as shown in the picture). We are now going to bypass ROC7.

Picture	Comment
	resoldered the capacitor and symptoms stay the same. Only first 7 ROCs visible in the Aout (as shown in the picture). We are now going to bypass ROC7.

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 140 146 152 144 162 156 158 144 164 290

Vana, VanaData 137 128 144 135 144 131 131 126 132 127

CalDelData and plots 73 76 57 62 78 90 72 76 61 0

VthrCompData and plots 76 83 89 84 79 72 80 72 86 0

TestDdata ,TestD Plots 9 0 1 0 1 51 2 0 170 0

LightData ,Light Plots 0 0 0 0 1 0 0 0 1 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD BAD GOOD GOOD BAD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	120	130	105	120	85	125	110	130
Vsf	140	135	140	140	145	135	140	135
VoffsetOp	70	75	80	70	80	95	85	75
VIbias_PH	95	105	95	95	100	95	95	95

ROC0 NOISE			MEAN = 5.072471 SIGMA = 0.445685
ROC1 NOISE			MEAN = 4.923205 SIGMA = 0.399550
ROC2 NOISE			MEAN = 4.187313 SIGMA = 0.366542
ROC3 NOISE			MEAN = 4.785623 SIGMA = 0.415223
ROC4 NOISE			MEAN = 4.248623 SIGMA = 0.363440
ROC5 NOISE			MEAN = 3.923394 SIGMA = 0.314292
ROC6 NOISE			MEAN = 4.247869 SIGMA = 0.336440
ROC7 NOISE			MEAN = 4.501379 SIGMA = 0.345166
ROC8 NOISE			MEAN = NaN SIGMA = NaN
ROC9 NOISE			MEAN = NaN SIGMA = NaN

Comment (if any):

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_2x5_079_A-1.html,

P_2x5_079_A.html,

End testing time: 4:05 PM

Ibias_DAC, Ibias_DAC Data	140	146	152	144	162	156	158	144	164	290
Vana, VanaData	137	128	144	135	144	131	131	126	132	127
CalDelData and plots	73	76	57	62	78	90	72	76	61	0
VthrCompData and plots	76	83	89	84	79	72	80	72	86	0
TestDdata ,TestD Plots	9	0	1	0	1	51	2	0	170	0
LightData ,Light Plots	0	0	0	0	1	0	0	0	1	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	BAD	GOOD	GOOD	BAD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD