P_2x5_024_C

Production testing

Date:5/2/2007

Operator: Isaac Childres

start testing time:10:51 AM

Sensor: S_2x5_024, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0X94KFJT41C
ROC1X94KFJT32A
ROC2X94KFJT31B
ROC3X94KFJT31A
ROC4X94KFJT30B
ROC5X94KFJT41D
ROC6X94KFJT42C
ROC7X94KFJT41B
ROC8X94KFJT52C
ROC9DWLQFTT14D

Depletion Voltage is -48 and suggested operational voltage is -88
Ibias_DAC, Ibias_DAC Data 136 158 144 134 138 150 146 152 142 142
Vana, VanaData 107 140 139 146 127 135 154 135 126 146
CalDelData and plots100759077849583879197
VthrCompData and plots76788393727089837286
TestDdata ,TestD Plots030400540814076408440093935170
LightData ,Light Plots24415341574158415741574128500
Pass/Fail TestD GOOD GOOD BAD BAD BAD BAD BAD BAD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD BAD BAD BAD BAD BAD BAD BAD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe165105130110125120010013095
Vsf1401401451401401450140140150
VoffsetOp801308010065851359065115
VIbias_PH9510010010095100105100105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.559820

SIGMA = 0.361717
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.673658

SIGMA = 0.271611
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.803881

SIGMA = 0.388540
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.777610

SIGMA = 0.386048
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.761129

SIGMA = 0.393099
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.408737

SIGMA = 0.358074
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = NaN

SIGMA = NaN
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.545911

SIGMA = 0.366074
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 5.070075

SIGMA = 0.386848
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 4.180454

SIGMA = 0.336201

Comment (if any): Pretty much all bad pixels.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:12 AM