P_2x4T_175_A-1

Production testing

Date:2/1/2007

Operator: Isaac Childres

start testing time:3:40 PM

Sensor: S_2x4T_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W28_X54K5TT52D
ROC1W28_X54K5TT52B
ROC2W28_X54K5TT52A
ROC3W28_X54K5TT51D
ROC4W28_X54K5TT49D
ROC5W28_X54K5TT30A
ROC6W28_X54K5TT30B
ROC7W28_X54K5TT30C

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 148 140 134 150 146 136 130 144
Vana, VanaData 135 134 140 135 138 127 127 135
TestDdata ,TestD Plots00000000
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4T_175_A.html,

End testing time: 3:45 PM