P_2x4T_123_A

Production testing

Date:12/17/2007

Operator: Ozhan Koybasi

start testing time:2:06 PM

Sensor: S_2x4T_12, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W47_DXLQF5T13D
ROC1W47_DXLQF5T13A
ROC2W47_DXLQF5T12D
ROC3W47_DXLQF5T12C
ROC4W55_D3LQE4T66C
ROC5W52_DOLQC8T55D
ROC6W55_D3LQE4T04D
ROC7W55_D3LQE4T67B

Depletion Voltage is -42 and suggested operational voltage is -82
Ibias_DAC, Ibias_DAC Data 142 156 142 150 146 142 156 134
Vana, VanaData 144 157 129 135 144 141 154 127
CalDelData and plots98671008988838295
VthrCompData and plots9288697984829178
TestDdata ,TestD Plots100000140
LightData ,Light Plots219220220222219222216222
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT BAD BAD BAD BAD BAD BAD BAD BAD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe10011010010010595100125
Vsf140150140140145140150135
VoffsetOp10011590909010512090
VIbias_PH100100100100100100100105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.450356

SIGMA = 0.346885
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.003679

SIGMA = 0.341074
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.262856

SIGMA = 0.338065
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.115483

SIGMA = 0.343483
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.269418

SIGMA = 0.335772
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.823512

SIGMA = 0.296043
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 3.948617

SIGMA = 0.296785
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.490979

SIGMA = 0.362145

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:35 PM