P_2x4T_004_C-1

Production testing

Date:2/9/2007

Operator: Isaac Childres

start testing time:1:03 PM

Sensor: S_2x4T_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XG4KFCT75D
ROC1XG4KFCT75C
ROC2XG4KFCT74D
ROC3XG4KFCT74C
ROC4XG4KFCT68A
ROC5XG4KFCT68B
ROC6XG4KFCT73C
ROC7XG4KFCT73D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 144 154 130 134 142 142 148 134
Vana, VanaData 138 131 134 127 143 127 118 131
TestDdata ,TestD Plots02000000
LightData ,Light Plots00000100
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 6.056050

SIGMA = 0.443653
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.639647

SIGMA = 0.374131
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.573430

SIGMA = 0.356842
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.048560

SIGMA = 0.405107
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.104593

SIGMA = 0.391440
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.003888

SIGMA = 0.322642
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.733782

SIGMA = 0.407459
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.423420

SIGMA = 0.342035

Comment (if any): Good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4T_004_C.html,

End testing time: 1:14 PM