P_2x4B_172_C-3

Production testing

Date:8/3/2007

Operator: Isaac Childres

start testing time:11:45 AM

Sensor: S_2x4B_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XH4KFBT49D
ROC1XH4KFBT40A
ROC2XH4KFBT40B
ROC3XH4KFBT41A
ROC4XH4KFBT41B
ROC5XH4KFBT42A
ROC6XH4KFBT42B
ROC7XH4KFBT43A

This plaquette was reworked. Old results here

Inspected by Arndt Kirk on date 7/30/2007
PictureComment
[IMAGE] of Picture of substance on backside of ROC0 (representative of substance on backsides of all original ROCs) in the reworked BMM. The substance is not removed by gentle swabbing with alcohol.

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 176 146 148 144 154 146 160 138
Vana, VanaData 148 124 124 127 130 131 141 127
CalDelData and plots7887788779827087
VthrCompData and plots8474727475857670
TestDdata ,TestD Plots527100101
LightData ,Light Plots933200101
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe90125120130130130125125
Vsf150135130140140140140140
VoffsetOp11070606080656545
VIbias_PH100100105100100100105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.615362

SIGMA = 0.272006
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.921821

SIGMA = 0.400229
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.300598

SIGMA = 0.339690
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.806053

SIGMA = 0.379948
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.592098

SIGMA = 0.356413
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.724914

SIGMA = 0.371041
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.814263

SIGMA = 0.407656
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 5.118281

SIGMA = 0.433542

Comment (if any): Noise test ran twice for some reason, but otherwise A-okay!

This Device have been tested 3Times prior to this one and here are the links to the previous tests:

P_2x4B_172_C-1.html,

P_2x4B_172_C-2.html,

P_2x4B_172_C.html,

End testing time: 12:13 PM