P_2x4B_117_A-1

Production testing

Date:2/2/2007

Operator: Isaac Childres

start testing time:1:35 PM

Sensor: S_2x4B_11, Data for leakage current measurement , and plot on overall it is a BAD sensor
ROCROC waferLabel
ROC0W32_XA4K5NT04C
ROC1W32_XA4K5NT04B
ROC2W32_XA4K5NT04A
ROC3W32_XA4K5NT03D
ROC4W31_X44K5UT68A
ROC5W31_X44K5UT51A
ROC6W31_X44K5UT51B
ROC7W31_X44K5UT51C

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 132 140 142 132 144 144 142 142
Vana, VanaData 125 146 131 125 132 127 131 134
TestDdata ,TestD Plots000000224
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Bad IV.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4B_117_A.html,

End testing time: 1:40 PM