P_2x4B_107_A-1

Production testing

Date:1/19/2007

Operator: Isaac Childres

start testing time:2:19 PM

Sensor: S_2x4B_10, Data for leakage current measurement , and plot on overall it is a BAD sensor
ROCROC waferLabel
ROC0W13_XX4JPAT21C
ROC1W13_XX4JPAT21B
ROC2W13_XX4JPAT21A
ROC3W13_XX4JPAT20B
ROC4W13_XX4JPAT22D
ROC5W13_XX4JPAT23B
ROC6W13_XX4JPAT23C
ROC7W13_XX4JPAT23D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 134 132 130 154 142 130 126 130
Vana, VanaData 127 127 116 131 124 129 123 127
TestDdata ,TestD Plots01000010
LightData ,Light Plots00000001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Bad IV, but otherwise good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4B_107_A.html,

End testing time: 2:25 PM