P_2x4B_062

P_2x4B_062_C

Production testing

Date:8/22/2007

Operator: Emily Grace

start testing time:2:59 PM

Sensor: S_2x4B_06, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XH4KFBT 25B

ROC1 KFNG13T 43D

ROC2 XH4KFBT 15A

ROC3 XH4KFBT 16D

ROC4 XH4KFBT 28D

ROC5 XH4KFBT 11A

ROC6 XH4KFBT 28C

ROC7 XH4KFBT 15B

ROC	ROC wafer	Label
ROC0	XH4KFBT	25B
ROC1	KFNG13T	43D
ROC2	XH4KFBT	15A
ROC3	XH4KFBT	16D
ROC4	XH4KFBT	28D
ROC5	XH4KFBT	11A
ROC6	XH4KFBT	28C
ROC7	XH4KFBT	15B

This plaquette was reworked. Old results here

Inspected by Lockwood Gale on date 8/21/2007

LR_dev 0.054

LL_dev 0.005

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood Gale

Assembled at HALF-PRESSURE. No assembly problems. No wirebonding problems.

PLAQUETTE made READY for ENCAPSULATION on 8/21/2007 by Lockwood Gale

PLAQUETTE encapsulated on 8/21/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 8/21/2007 by Ozhan Koybasi

P_2x4B_062_Con 8/22/2007 2:59 PM

Depletion Voltage is -42 and suggested operational voltage is -82

Ibias_DAC, Ibias_DAC Data	134	166	178	150	156	158	154	154
Vana, VanaData	125	151	146	115	130	128	134	128
CalDelData and plots	80	59	83	89	83	90	91	74
VthrCompData and plots	83	91	83	74	73	78	64	82
TestDdata ,TestD Plots	1	0	0	0	2	0	2	1
LightData ,Light Plots	1	0	0	0	3	0	0	1
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	140	100	90	150	135	150	100	125
Vsf	140	155	150	140	135	140	135	135
VoffsetOp	70	90	105	65	85	65	80	80
VIbias_PH	95	105	100	105	100	95	105	95

ROC0 NOISE			MEAN = 4.369003 SIGMA = 0.363659
ROC1 NOISE			MEAN = 4.428417 SIGMA = 0.351114
ROC2 NOISE			MEAN = 3.441165 SIGMA = 0.276951
ROC3 NOISE			MEAN = 4.717353 SIGMA = 0.363191
ROC4 NOISE			MEAN = 4.486409 SIGMA = 0.366733
ROC5 NOISE			MEAN = 4.278306 SIGMA = 0.344523
ROC6 NOISE			MEAN = 4.699650 SIGMA = 0.363446
ROC7 NOISE			MEAN = 4.528807 SIGMA = 0.387863

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 3:26 PM