P_2x4B_040_A

Production testing

Date:8/15/2007

Operator: Emily Grace

start testing time:5:02 PM

Sensor: S_2x4B_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W13_XX4JPAT06C
ROC1W33_XC4K5LT04C
ROC2W35_XH4K3HT58A
ROC3W35_XH4K3HT57D
ROC4W36_XD4K3LT12D
ROC5W36_XD4K3LT13A
ROC6W36_XD4K3LT13B
ROC7W36_XD4K3LT13C

This plaquette was reworked. Old results here

Inspected by Lockwood Gale on date 8/15/2007
LR_dev0.085
LL_dev0.040

PLAQUETTE GLUED with FULL PRESSURE

FINAL COMMENT by Lockwood GaleNO ASSEMBLY PROBLEMS No wirebonding problems

PLAQUETTE made READY for ENCAPSULATION on 8/15/2007 by Lockwood Gale

PLAQUETTE encapsulated on 8/15/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 8/15/2007 by Ozhan Koybasi

P_2x4B_040_Aon 8/15/2007 5:02 PM

Ibias_DAC, Ibias_DAC Data 146 160 170 144 158 156 150 144
Vana, VanaData 128 137 138 114 123 131 131 123