Sensor: S_2x4B_01, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | W53_DXLQG9T | 67B |
ROC1 | W53_DXLQG9T | 67A |
ROC2 | W53_DXLQG9T | 66C |
ROC3 | W53_DXLQG9T | 66B |
ROC4 | W53_DXLQG9T | 48B |
ROC5 | W53_DXLQG9T | 48C |
ROC6 | W53_DXLQG9T | 48D |
ROC7 | W53_DXLQG9T | 49A |
Inspected by Lockwood Gale on date 12/4/2007
LR_dev | 0.046 |
LL_dev | 0.035 |
PLAQUETTE GLUED with HALF PRESSURE
FINAL COMMENT by Lockwood Gale | Force used to join BBM to VHDI = 2.5 kg per ROC. No assembly problems. ROC 3, Ch 23,2FL,2 tries, ROC 7, CH 1,2,3,4 2-4 tries, ROC 3, Ch 23,2FL, 2 tries, no other wirebonding problems. |
PLAQUETTE made READY for ENCAPSULATION on 12/4/2007 by Lockwood Gale
PLAQUETTE encapsulated on 12/4/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 12/4/2007 by Ozhan Koybasi
P_2x4B_019_Aon 12/7/2007 11:10 AM
Ibias_DAC, Ibias_DAC Data | 164 | 158 | 144 | 156 | 154 | 160 | 160 | 160 |
Vana, VanaData | 149 | 158 | 141 | 142 | 154 | 144 | 150 | 145 |
CalDelData and plots | 76 | 90 | 86 | 68 | 82 | 71 | 93 | 80 |
VthrCompData and plots | 87 | 87 | 75 | 93 | 84 | 90 | 83 | 85 | Depletion Voltage is -50 and suggested operational voltage is -90
TestDdata ,TestD Plots | 1 | 8 | 0 | 0 | 2 | 0 | 3 | 5 |
LightData ,Light Plots | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 |
Pass/Fail TestD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Noise MAP at VMAX
Efficiency MAP
EXTRA DACs for NOISE
VHldDe | 95 | 90 | 95 | 95 | 90 | 100 | 95 | 90 |
Vsf | 155 | 155 | 140 | 140 | 150 | 145 | 150 | 145 |
VoffsetOp | 120 | 125 | 95 | 110 | 115 | 115 | 95 | 95 |
VIbias_PH | 100 | 105 | 95 | 100 | 105 | 100 | 95 | 95 |
Comment (if any):
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 11:41 AM