P_2x4B_005_A-1

Production testing

Date:11/16/2007

Operator: Ozhan Koybasi

start testing time:11:30 AM

Sensor: S_2x4B_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W47_DXLQF5T27D
ROC1W47_DXLQF5T27A
ROC2W47_DXLQF5T26C
ROC3W47_DXLQF5T38C
ROC4W55_D3LQE4T75D
ROC5W55_D3LQE4T76C
ROC6W55_D3LQE4T61B
ROC7W55_D3LQE4T61D

Depletion Voltage is -50 and suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 158 150 146 150 144 158 156 142
Vana, VanaData 153 126 144 147 126 153 144 146
CalDelData and plots80918389941029284
VthrCompData and plots9383878490858682
TestDdata ,TestD Plots03737285424652
LightData ,Light Plots00000000
Pass/Fail TestD GOOD GOOD GOOD BAD BAD BAD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe1001251001001359010090
Vsf150135145150140155145145
VoffsetOp125801301006595105100
VIbias_PH10010095100100959595
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.786375

SIGMA = 0.293501
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.447446

SIGMA = 0.359110
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.923524

SIGMA = 0.310671
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.262236

SIGMA = 0.320216
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.752496

SIGMA = 0.379119
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.865732

SIGMA = 0.298962
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.055811

SIGMA = 0.336364
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.235443

SIGMA = 0.321575

Comment (if any): TestD showed too many bad pixels

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x4B_005_A.html,

End testing time: 11:58 AM