P_2x4B_005_A

Production testing

Date:11/15/2007

Operator: Ozhan Koybasi

start testing time:5:07 PM

Sensor: S_2x4B_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W47_DXLQF5T27D
ROC1W47_DXLQF5T27A
ROC2W47_DXLQF5T26C
ROC3W47_DXLQF5T38C
ROC4W55_D3LQE4T75D
ROC5W55_D3LQE4T76C
ROC6W55_D3LQE4T61B
ROC7W55_D3LQE4T61D

Depletion Voltage is -50 and suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 160 154 148 154 146 158 158 144
Vana, VanaData 151 125 144 146 125 153 144 146
CalDelData and plots79918388941029284
VthrCompData and plots9182888389858783
TestDdata ,TestD Plots000196336800
LightData ,Light Plots1331215270860406521102
Pass/Fail TestD GOOD GOOD GOOD GOOD BAD BAD GOOD GOOD
Pass/Fail LIGHT BAD BAD BAD GOOD GOOD GOOD BAD BAD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe100125100100130909590
Vsf150135145145135155140150
VoffsetOp125801301006595105100
VIbias_PH1001009510010010010095
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.764618

SIGMA = 0.307474
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.424912

SIGMA = 0.353014
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.909570

SIGMA = 0.305137
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.234270

SIGMA = 0.332164
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.752737

SIGMA = 0.376361
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.959907

SIGMA = 0.311650
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.214906

SIGMA = 0.358976
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.207393

SIGMA = 0.330266

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 5:41 PM