P_2x3T_114_A-1

Production testing

Date:2/9/2007

Operator: Cameron McKinney

start testing time:11:50 AM

Sensor: S_2x3T_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W30_X74K5RT33A
ROC1W30_X74K5RT32D
ROC2W30_X74K5RT32C
ROC3W30_X74K5RT12D
ROC4W30_X74K5RT13C
ROC5W30_X74K5RT13D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 128 134 144 138 138 140
Vana, VanaData 128 129 133 140 140 129
TestDdata ,TestD Plots000000
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.194791

SIGMA = 0.334320
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.382117

SIGMA = 0.332530
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.488548

SIGMA = 0.349342
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.838956

SIGMA = 0.404023
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.773090

SIGMA = 0.400866
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.383124

SIGMA = 0.355296

Comment (if any): OK.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3T_114_A.html,

End testing time: 12:02 PM