Sensor: S_2x3T_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | DWLQFTT | 54B |
ROC1 | KNNGODT | 43D |
ROC2 | DWLQFTT | 64D |
ROC3 | DWLQFTT | 54A |
ROC4 | DWLQFTT | 66A |
ROC5 | DWLQFTT | 63B |
This plaquette was reworked. Old results here
Inspected by Arndt Kirk on date 8/28/2007
LR_dev | 0.011 |
LL_dev | 0.008 |
PLAQUETTE GLUED with HALF PRESSURE
FINAL COMMENT by Arndt Kirk | Assembled at HALF-PRESSURE. No assembly problems. ROC0 ch 24,33,35; ROC1 ch 1; ROC2 ch 35 required multiple bond attempts to stick bonds to VHDI pads. No other wirebond problems. All wirebonds appear OK. |
PLAQUETTE made READY for ENCAPSULATION on 8/28/2007 by Arndt Kirk
PLAQUETTE encapsulated on 8/28/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 8/28/2007 by Ozhan Koybasi
P_2x3T_111_Con 8/30/2007 3:25 PM
Ibias_DAC, Ibias_DAC Data | 156 | 162 | 156 | 144 | 164 | 144 |
Vana, VanaData | 142 | 121 | 159 | 139 | 150 | 137 |
CalDelData and plots | 85 | 78 | 88 | 96 | 79 | 86 |
VthrCompData and plots | 87 | 77 | 91 | 79 | 91 | 86 | Depletion Voltage is -46 and suggested operational voltage is -86
TestDdata ,TestD Plots | 1 | 74 | 0 | 46 | 87 | 20 |
LightData ,Light Plots | 0 | 2 | 9 | 73 | 548 | 30 |
Pass/Fail TestD | GOOD | BAD | GOOD | BAD | BAD | GOOD |
Pass/Fail LIGHT | GOOD | GOOD | GOOD | BAD | BAD | GOOD |
Noise MAP at VMAX
Efficiency MAP
EXTRA DACs for NOISE
VHldDe | 90 | 150 | 95 | 95 | 100 | 115 |
Vsf | 140 | 140 | 155 | 140 | 150 | 140 |
VoffsetOp | 95 | 55 | 110 | 85 | 115 | 90 |
VIbias_PH | 105 | 105 | 100 | 100 | 100 | 105 |
Comment (if any): Many unbumped pixels on ROCs 3, 4, and 5. Otherwise good.
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 5:15 PM