P_2x3T_045_C-2

Production testing

Date:2/8/2007

Operator: Gino Bolla

start testing time:3:07 PM

Sensor: S_2x3T_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4K3KT67D
ROC1XE4K3KT67A
ROC2XE4K3KT61C
ROC3XE4K3KT65D
ROC4XE4K3KT66B
ROC5XE4K3KT61D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 134 130 142 130 144 134
Vana, VanaData 127 124 114 127 141 124
TestDdata ,TestD Plots001110
LightData ,Light Plots201302
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.380663

SIGMA = 0.336252
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.563302

SIGMA = 0.361686
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.522479

SIGMA = 0.336514
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.000457

SIGMA = 0.301115
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.717784

SIGMA = 0.389007
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.306569

SIGMA = 0.327042

Comment (if any):

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_2x3T_045_C-1.html,

P_2x3T_045_C.html,

End testing time: 3:20 PM