P_2x3T_036_C-1

Production testing

Date:1/17/2007

Operator: Isaac Childres

start testing time:11:22 AM

Sensor: S_2x3T_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET75C
ROC1XE4KFET73B
ROC2XE4KFET76D
ROC3XE4KFET76B
ROC4XE4KFET65B
ROC5XE4KFET63D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 140 144 130 146 132 144
Vana, VanaData 129 133 129 134 122 141
TestDdata ,TestD Plots1019000
LightData ,Light Plots1020001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Okay.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3T_036_C.html,

End testing time: 11:28 AM