P_2x3T_032_C

Production testing

Date:4/17/2007

Operator: Gino Bolla

start testing time:10:21 AM

Sensor: S_2x3T_03, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XW4KFXT23D
ROC1XH4KFBT21D
ROC2XH4KFBT22C
ROC3XH4KFBT24D
ROC4XH4KFBT23A
ROC5XH4KFBT22A

Inspected by Lockwood Gale on date 4/11/2007
LR_dev0.071
LL_dev0.069

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood GaleNo assembly problems. Assembled at HALF-PRESSURE.No wirebond problems.

PLAQUETTE made READY for ENCAPSULATION on 4/11/2007 by Lockwood Gale

PLAQUETTE encapsulated on 4/12/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 4/12/2007 by Ozhan Koybasi

P_2x3T_032_Con 4/17/2007 10:21 AM

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 134 130 134 138 126 128
Vana, VanaData 130 138 143 133 111 125
CalDelData and plots8886778510081
VthrCompData and plots747486645870
TestDdata ,TestD Plots001110
LightData ,Light Plots000110
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe12585105105175140
Vsf140140140140135135
VoffsetOp709090857095
VIbias_PH95105100100105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.802985

SIGMA = 0.410972
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.136208

SIGMA = 0.400403
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.703820

SIGMA = 0.346274
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.537821

SIGMA = 0.358094
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.370094

SIGMA = 0.423654
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.969026

SIGMA = 0.398039

Comment (if any): GOOD

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 10:40 AM