P_2x3T_025_C-1

Production testing

Date:1/24/2007

Operator: Isaac Childres

start testing time:10:53 AM

Sensor: S_2x3T_02, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4KFET24B
ROC1XE4KFET35C
ROC2XE4KFET35D
ROC3XE4KFET30D
ROC4XE4KFET36C
ROC5XE4KFET25C

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 130 128 142 130 128 130
Vana, VanaData 122 126 122 122 121 141
TestDdata ,TestD Plots000202
LightData ,Light Plots000001
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Okay.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3T_025_C.html,

End testing time: 10:58 AM