P_2x3T_004_C-1

Production testing

Date:2/12/2007

Operator: Isaac Childres

start testing time:1:34 PM

Sensor: S_2x3T_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4K3KT06A
ROC1XE4K3KT11C
ROC2XE4K3KT11D
ROC3XE4K3KT13D
ROC4XE4K3KT13C
ROC5XE4K3KT12D

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 118 126 128 132 140 118
Vana, VanaData 117 127 124 123 133 137
TestDdata ,TestD Plots211002
LightData ,Light Plots600021
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Comment (if any): Okay.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3T_004_C.html,

End testing time: 1:40 PM