P_2x3T_004

P_2x3T_004_C

Production testing

Date:2/8/2007

Operator: Isaac Childres

start testing time:4:35 PM

Sensor: S_2x3T_00, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XE4K3KT 06A

ROC1 XE4K3KT 11C

ROC2 XE4K3KT 11D

ROC3 XE4K3KT 13D

ROC4 XE4K3KT 13C

ROC5 XE4K3KT 12D

ROC	ROC wafer	Label
ROC0	XE4K3KT	06A
ROC1	XE4K3KT	11C
ROC2	XE4K3KT	11D
ROC3	XE4K3KT	13D
ROC4	XE4K3KT	13C
ROC5	XE4K3KT	12D

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 118 126 128 132 140 118

Vana, VanaData 117 127 124 123 133 137

CalDelData and plots 100 76 87 93 70 88

VthrCompData and plots 72 70 68 68 88 78

TestDdata ,TestD Plots 2 0 1 0 0 1

LightData ,Light Plots 6 0 0 0 2 1

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

ROC0 NOISE			MEAN = 5.353304 SIGMA = 0.427419
ROC1 NOISE			MEAN = 4.765691 SIGMA = 0.387230
ROC2 NOISE			MEAN = 4.081159 SIGMA = 0.305049
ROC3 NOISE			MEAN = 4.589248 SIGMA = 0.359587
ROC4 NOISE			MEAN = 5.029859 SIGMA = 0.383295
ROC5 NOISE			MEAN = 5.139176 SIGMA = 0.422279

Comment (if any): Okay.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 4:52 PM

Ibias_DAC, Ibias_DAC Data	118	126	128	132	140	118
Vana, VanaData	117	127	124	123	133	137
CalDelData and plots	100	76	87	93	70	88
VthrCompData and plots	72	70	68	68	88	78
TestDdata ,TestD Plots	2	0	1	0	0	1
LightData ,Light Plots	6	0	0	0	2	1
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD