P_2x3B_171_A-5

Production testing

Date:2/9/2007

Operator: Isaac Childres

start testing time:12:34 PM

Sensor: S_2x3B_17, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W30_X74K5RT27D
ROC1W30_X74K5RT27C
ROC2W30_X74K5RT27A
ROC3W29_X64K5ST73C
ROC4W29_X64K5ST73D
ROC5W29_X64K5ST74A

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 142 130 144 132 146 144
Vana, VanaData 127 133 153 125 141 143
TestDdata ,TestD Plots000100
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.432521

SIGMA = 0.348384
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.197101

SIGMA = 0.330500
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.735610

SIGMA = 0.454263
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.708270

SIGMA = 0.373598
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.170715

SIGMA = 0.408441
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.653608

SIGMA = 0.393227

Comment (if any): Good.

This Device have been tested 5Times prior to this one and here are the links to the previous tests:

P_2x3B_171_A-1.html,

P_2x3B_171_A-2.html,

P_2x3B_171_A-3.html,

P_2x3B_171_A-4.html,

P_2x3B_171_A.html,

End testing time: 12:45 PM