P_2x3B_168_C-1

Production testing

Date:5/23/2007

Operator: Emily Grace

start testing time:11:35 AM

Sensor: S_2x3B_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KBNG0QT24B
ROC1KBNG0QT54B
ROC2KBNG0QT75C
ROC3KBNG0QT55B
ROC4KBNG0QT44D
ROC5KBNG0QT64B

Depletion Voltage is -50 and suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 160 146 172 146 156 170
Vana, VanaData 146 121 142 141 143 148
CalDelData and plots637579886160
VthrCompData and plots927788748990
TestDdata ,TestD Plots110101
LightData ,Light Plots100004
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9513012595100100
Vsf145135140140145145
VoffsetOp105851108085130
VIbias_PH959510010095100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.081718

SIGMA = 0.351306
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.979160

SIGMA = 0.328643
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.627982

SIGMA = 0.291085
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.785072

SIGMA = 0.397990
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.680616

SIGMA = 0.376284
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.369358

SIGMA = 0.262205

Comment (if any):

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3B_168_C.html,

End testing time: 12:00 PM