P_2x3B_168_C

Production testing

Date:5/22/2007

Operator: Emily Grace

start testing time:1:47 PM

Sensor: S_2x3B_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KBNG0QT24B
ROC1KBNG0QT54B
ROC2KBNG0QT75C
ROC3KBNG0QT55B
ROC4KBNG0QT44D
ROC5KBNG0QT64B

Depletion Voltage is -56 and suggested operational voltage is -96
Ibias_DAC, Ibias_DAC Data 160 146 170 146 156 170
Vana, VanaData 146 121 142 141 143 148
CalDelData and plots637579886160
VthrCompData and plots927788748990
TestDdata ,TestD Plots113001
LightData ,Light Plots100004
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe9512512590100100
Vsf145130140140145145
VoffsetOp105851108085130
VIbias_PH9510010010095100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.078529

SIGMA = 0.334536
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.123878

SIGMA = 0.334716
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.618743

SIGMA = 0.284019
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.803824

SIGMA = 0.381336
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.686168

SIGMA = 0.384084
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 3.366909

SIGMA = 0.263930

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 2:11 PM