Sensor: S_2x3B_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | W53_DXLQG9T | 40D |
ROC1 | W53_DXLQG9T | 40C |
ROC2 | W53_DXLQG9T | 40B |
ROC3 | W53_DXLQG9T | 36C |
ROC4 | W53_DXLQG9T | 37B |
ROC5 | W53_DXLQG9T | 37D |
Inspected by Lockwood Gale on date 12/11/2007
LR_dev | 0.051 |
LL_dev | 0.054 |
PLAQUETTE GLUED with HALF PRESSURE
FINAL COMMENT by Lockwood Gale | Force used to join BBM to VHDI = 2.5 kg per ROC. No assembly problems. ROC3 ch7 wo 2 tries. No other wirebonding problems. |
PLAQUETTE made READY for ENCAPSULATION on 12/11/2007 by Lockwood Gale
PLAQUETTE encapsulated on 12/12/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 12/12/2007 by Ozhan Koybasi
P_2x3B_164_Aon 12/13/2007 11:31 AM
Ibias_DAC, Ibias_DAC Data | 148 | 156 | 152 | 150 | 150 | 156 |
Vana, VanaData | 141 | 149 | 135 | 145 | 139 | 162 |
CalDelData and plots | 86 | 97 | 92 | 73 | 85 | 84 |
VthrCompData and plots | 84 | 81 | 78 | 90 | 83 | 93 | Depletion Voltage is -46 and suggested operational voltage is -86
TestDdata ,TestD Plots | 1 | 0 | 0 | 0 | 0 | 0 |
LightData ,Light Plots | 0 | 0 | 0 | 0 | 0 | 0 |
Pass/Fail TestD | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Pass/Fail LIGHT | GOOD | GOOD | GOOD | GOOD | GOOD | GOOD |
Noise MAP at VMAX
Efficiency MAP
EXTRA DACs for NOISE
VHldDe | 100 | 90 | 105 | 95 | 100 | 95 |
Vsf | 140 | 150 | 140 | 145 | 140 | 155 |
VoffsetOp | 110 | 110 | 105 | 110 | 95 | 110 |
VIbias_PH | 95 | 100 | 100 | 100 | 105 | 95 |
Comment (if any):
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 11:59 AM