P_2x3B_164_A

Production testing

Date:12/13/2007

Operator: Ozhan Koybasi

start testing time:11:31 AM

Sensor: S_2x3B_16, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W53_DXLQG9T40D
ROC1W53_DXLQG9T40C
ROC2W53_DXLQG9T40B
ROC3W53_DXLQG9T36C
ROC4W53_DXLQG9T37B
ROC5W53_DXLQG9T37D

Inspected by Lockwood Gale on date 12/11/2007
LR_dev0.051
LL_dev0.054

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood GaleForce used to join BBM to VHDI = 2.5 kg per ROC. No assembly problems. ROC3 ch7 wo 2 tries. No other wirebonding problems.

PLAQUETTE made READY for ENCAPSULATION on 12/11/2007 by Lockwood Gale

PLAQUETTE encapsulated on 12/12/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 12/12/2007 by Ozhan Koybasi

P_2x3B_164_Aon 12/13/2007 11:31 AM

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 148 156 152 150 150 156
Vana, VanaData 141 149 135 145 139 162
CalDelData and plots869792738584
VthrCompData and plots848178908393
TestDdata ,TestD Plots100000
LightData ,Light Plots000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe100901059510095
Vsf140150140145140155
VoffsetOp11011010511095110
VIbias_PH9510010010010595
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.842469

SIGMA = 0.307195
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 3.689671

SIGMA = 0.282736
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.379998

SIGMA = 0.343312
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.150891

SIGMA = 0.321071
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.620149

SIGMA = 0.372766
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.015853

SIGMA = 0.321960

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:59 AM