Sensor: S_2x3B_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROC | ROC wafer | Label |
---|---|---|
ROC0 | XH4KFBT | 13C |
ROC1 | XH4KFBT | 39C |
ROC2 | XH4KFBT | 29A |
ROC3 | XH4KFBT | 11B |
ROC4 | XH4KFBT | 35D |
ROC5 | XH4KFBT | 26B |
Inspected by Arndt Kirk on date 4/12/2007
Picture | Comment |
---|---|
Droplet of clear material on top of ROC5. . |
Inspected by Lockwood Gale on date 4/12/2007
LR_dev | 0.069 |
LL_dev | 0.065 |
PLAQUETTE GLUED with HALF PRESSURE
FINAL COMMENT by Lockwood Gale | No assembly problems. Assembled at HALF-PRESSURE.No wirebond problems. |
PLAQUETTE made READY for ENCAPSULATION on 4/12/2007 by Lockwood Gale
PLAQUETTE encapsulated on 4/12/2007 by Ozhan Koybasi
PLAQUETTE made READY for testing on 4/12/2007 by Ozhan Koybasi
P_2x3B_110_Con 4/17/2007 12:01 PM
Ibias_DAC, Ibias_DAC Data | 144 | 140 | 148 | 122 | 134 | 144 |
Vana, VanaData | 138 | 137 | 143 | 107 | 129 | 131 |
CalDelData and plots | 78 | 93 | 79 | 103 | 83 | 78 |
VthrCompData and plots | 76 | 76 | 88 | 65 | 66 | 74 | Depletion Voltage is -44 and suggested operational voltage is -84
TestDdata ,TestD Plots | 0 | 1 | 222 | 1 | 0 | 389 |
LightData ,Light Plots | 0 | 0 | 341 | 1 | 0 | 670 |
Pass/Fail TestD | GOOD | GOOD | BAD | GOOD | GOOD | BAD |
Pass/Fail LIGHT | GOOD | GOOD | BAD | GOOD | GOOD | BAD |
Noise MAP
Efficiency MAP
EXTRA DACs for NOISE
VHldDe | 105 | 105 | 120 | 155 | 100 | 115 |
Vsf | 140 | 140 | 145 | 130 | 135 | 140 |
VoffsetOp | 90 | 80 | 110 | 70 | 60 | 75 |
VIbias_PH | 100 | 105 | 100 | 95 | 100 | 100 |
Comment (if any): MANY MANY UNBUMPED
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 12:21 PM