P_2x3B_110_C

Production testing

Date:4/17/2007

Operator: Gino Bolla

start testing time:12:01 PM

Sensor: S_2x3B_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XH4KFBT13C
ROC1XH4KFBT39C
ROC2XH4KFBT29A
ROC3XH4KFBT11B
ROC4XH4KFBT35D
ROC5XH4KFBT26B

Inspected by Arndt Kirk on date 4/12/2007
PictureComment
[IMAGE] of Droplet of clear material on top of ROC5. .

Inspected by Lockwood Gale on date 4/12/2007
LR_dev0.069
LL_dev0.065

PLAQUETTE GLUED with HALF PRESSURE

FINAL COMMENT by Lockwood GaleNo assembly problems. Assembled at HALF-PRESSURE.No wirebond problems.

PLAQUETTE made READY for ENCAPSULATION on 4/12/2007 by Lockwood Gale

PLAQUETTE encapsulated on 4/12/2007 by Ozhan Koybasi

PLAQUETTE made READY for testing on 4/12/2007 by Ozhan Koybasi

P_2x3B_110_Con 4/17/2007 12:01 PM

Depletion Voltage is -44 and suggested operational voltage is -84
Ibias_DAC, Ibias_DAC Data 144 140 148 122 134 144
Vana, VanaData 138 137 143 107 129 131
CalDelData and plots7893791038378
VthrCompData and plots767688656674
TestDdata ,TestD Plots0122210389
LightData ,Light Plots0034110670
Pass/Fail TestD GOOD GOOD BAD GOOD GOOD BAD
Pass/Fail LIGHT GOOD GOOD BAD GOOD GOOD BAD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe105105120155100115
Vsf140140145130135140
VoffsetOp9080110706075
VIbias_PH10010510095100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.266635

SIGMA = 0.332882
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.892137

SIGMA = 0.393264
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.220009

SIGMA = 0.324196
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 5.157257

SIGMA = 0.402511
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.279029

SIGMA = 0.417477
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 5.014357

SIGMA = 0.441009

Comment (if any): MANY MANY UNBUMPED

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:21 PM